"Failure and reliability analysis of STT-MRAM."

Weisheng Zhao et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.035

access: closed

type: Journal Article

metadata version: 2022-10-02

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Weisheng Zhao, Yue Zhang, Thibaut Devolder, Jacques-Olivier Klein, Dafine Ravelosona, Claude Chappert, Pascale Mazoyer:
Failure and reliability analysis of STT-MRAM. Microelectron. Reliab. 52(9-10): 1848-1852 (2012)

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