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"Defect segmentation for multi-illumination quality control systems."

David Honzátko et al. (2021)

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DOI: 10.1007/S00138-021-01244-Z

access: open

type: Journal Article

metadata version: 2022-05-13

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  dblp key:
  - journals/mva/HonzatkoTBDF21
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  - https://dblp.org/rec/journals/mva/HonzatkoTBDF21
David Honzátko, Engin Türetken, Siavash Arjomand Bigdeli, L. Andrea Dunbar, Pascal Fua:
Defect segmentation for multi-illumination quality control systems. Mach. Vis. Appl. 32(6): 118 (2021)

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