"Minimization of test time in system on chip using artificial ..."

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DOI: 10.1007/S00521-019-04039-6

access: closed

type: Withdrawn Item

metadata version: 2024-07-19

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(Withdrawn) Minimization of test time in system on chip using artificial intelligence-based test scheduling techniques. Neural Comput. Appl. 32(9): 5303-5312 (2020)

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