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"Defect tolerance in VLSI circuits: techniques and yield analysis."

Israel Koren, Zahava Koren (1998)

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DOI: 10.1109/5.705525

access: closed

type: Journal Article

metadata version: 2022-02-28

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Israel Koren, Zahava Koren:
Defect tolerance in VLSI circuits: techniques and yield analysis. Proc. IEEE 86(9): 1819-1838 (1998)

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