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"Status of Reliability of GaN-Based Heterojunction Field Effect Transistors."
Jacob H. Leach, Hadis Morkoç (2010)
- Jacob H. Leach, Hadis Morkoç:
Status of Reliability of GaN-Based Heterojunction Field Effect Transistors. Proc. IEEE 98(7): 1127-1139 (2010)
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