"TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm ..."

Ramon Canal et al. (2011)

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DOI: 10.1016/J.PROCS.2011.09.010

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-06

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Ramon Canal, Antonio Rubio, A. Asenov, A. Brown, Miguel Miranda, Paul Zuber, Antonio González, Xavier Vera:
TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies. FET 2011: 148-149

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