"Simple Testing Can Expose Most Critical Transaction Bugs: Understanding ..."

Ziyu Cui et al. (2025)

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access: open

type: Journal Article

metadata version: 2025-09-14

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Ziyu Cui, Wensheng Dou, Yu Gao, Rui Yang, Yingying Zheng, Jiansen Song, Yuan Feng, Jun Wei:
Simple Testing Can Expose Most Critical Transaction Bugs: Understanding and Detecting Write-Specific Serializability Violations in Database Systems. Proc. VLDB Endow. 18(8): 2547-2560 (2025)

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