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"A reliability analysis for electronic devices under an extension of ..."

Luis Carlos Méndez González et al. (2023)

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DOI: 10.1002/QRE.3255

access: closed

type: Journal Article

metadata version: 2023-04-16

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Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Vicente García, Abel Eduardo Quezada-Carreón:
A reliability analysis for electronic devices under an extension of exponentiated perks distribution. Qual. Reliab. Eng. Int. 39(3): 776-795 (2023)

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