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"Determination of tolerance limits for the reliability of semiconductor ..."

Vera Hofer et al. (2017)

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DOI: 10.1002/QRE.2226

access: open

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/qre/HoferLLN17
Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak:
Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. Qual. Reliab. Eng. Int. 33(8): 2673-2683 (2017)

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