"Knowledge augmented broad learning system for computer vision based ..."

Junliang Wang et al. (2023)

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DOI: 10.1016/J.RCIM.2022.102513

access: closed

type: Journal Article

metadata version: 2023-09-30

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Junliang Wang, Pengjie Gao, Jie Zhang, Chao Lu, Bo Shen:
Knowledge augmented broad learning system for computer vision based mixed-type defect detection in semiconductor manufacturing. Robotics Comput. Integr. Manuf. 81: 102513 (2023)

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