Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Cascading failures modeling of electronic circuits with degradation using ..."

Yi Jin et al. (2023)

> Home

Details and statistics

DOI: 10.1016/J.RESS.2023.109101

access: closed

type: Journal Article

metadata version: 2023-03-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ress/JinZCLZ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ress/JinZCLZ23
Yi Jin, Qingyuan Zhang, Yunxia Chen, Zhendan Lu, Tianpei Zu:
Cascading failures modeling of electronic circuits with degradation using impedance network. Reliab. Eng. Syst. Saf. 233: 109101 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.