"Optimal design of step-stress accelerated degradation tests based on the ..."

Weian Yan et al. (2023)

> Home

Details and statistics

DOI: 10.1016/J.RESS.2022.108917

access: closed

type: Journal Article

metadata version: 2022-12-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ress/YanXBC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ress/YanXBC23
Weian Yan, Xiaofan Xu, David Bigaud, Wenqin Cao:
Optimal design of step-stress accelerated degradation tests based on the Tweedie exponential dispersion process. Reliab. Eng. Syst. Saf. 230: 108917 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.