"Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS."

Wei-Chang Yeh (2025)

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DOI: 10.1016/J.RESS.2025.111446

access: closed

type: Journal Article

metadata version: 2025-08-22

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Wei-Chang Yeh:
Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS. Reliab. Eng. Syst. Saf. 264: 111446 (2025)

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