"An entropy-based indicator system for measuring the potential of patents ..."

Yi Zhang et al. (2017)

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DOI: 10.1007/S11192-017-2337-7

access: closed

type: Journal Article

metadata version: 2024-08-21

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  - https://dblp.org/rec/journals/scientometrics/ZhangQHGZL17
Yi Zhang, Yue Qian, Ying Huang, Ying Guo, Guangquan Zhang, Jie Lu:
An entropy-based indicator system for measuring the potential of patents in technological innovation: rejecting moderation. Scientometrics 111(3): 1925-1946 (2017)

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