Stop the war!
Остановите войну!
for scientists:
default search action
"A test circuit for pin shorts generating oscillation in CMOS logic circuits."
Masahiro Ichimiya et al. (2004)
- Masahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
A test circuit for pin shorts generating oscillation in CMOS logic circuits. Syst. Comput. Jpn. 35(13): 10-20 (2004)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.