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"Design of testing circuit and test generation for built-in current testing."
Yukiya Miura, Yasushi Wada, Kozo Kinoshita (1993)
- Yukiya Miura, Yasushi Wada, Kozo Kinoshita:
Design of testing circuit and test generation for built-in current testing. Syst. Comput. Jpn. 24(5): 73-82 (1993)
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