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"Design of testing circuit and test generation for built-in current testing."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Yukiya Miura, Yasushi Wada, Kozo Kinoshita (1993)

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DOI: 10.1002/SCJ.4690240507

access: closed

type: Journal Article

metadata version: 2023-09-13

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  - https://dblp.org/rec/journals/scjapan/MiuraWK93
Yukiya Miura, Yasushi Wada, Kozo Kinoshita:
Design of testing circuit and test generation for built-in current testing. Syst. Comput. Jpn. 24(5): 73-82 (1993)

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