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"EB tester fault localization algorithm for combinational circuits by ..."

Koji Nakamae, Takashi Ishimura, Hiromu Fujioka (2000)

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DOI: 10.1002/1520-684X(200007)31:8<41::AID-SCJ5>3.0.CO;2-E

access: closed

type: Journal Article

metadata version: 2023-09-13

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Koji Nakamae, Takashi Ishimura, Hiromu Fujioka:
EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. Syst. Comput. Jpn. 31(8): 41-48 (2000)

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