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"Testability consideration based on a test pattern length estimation."

Shigeru Takasaki (1987)

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DOI: 10.1002/SCJ.4690180506

access: closed

type: Journal Article

metadata version: 2023-09-13

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Shigeru Takasaki:
Testability consideration based on a test pattern length estimation. Syst. Comput. Jpn. 18(5): 47-58 (1987)

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