"Update of Single Event Effects Radiation Hardness Assurance of Readout ..."

Laurent Artola et al. (2018)

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DOI: 10.3390/S18072338

access: open

type: Journal Article

metadata version: 2020-05-30

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  - https://dblp.org/rec/journals/sensors/ArtolaYDPBGMBHP18
Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivey:
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors 18(7): 2338 (2018)

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