"Measuring Nanoscale Distances by Structured Illumination Microscopy and ..."

Isotta Cainero et al. (2021)

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DOI: 10.3390/S21062010

access: open

type: Journal Article

metadata version: 2023-06-26

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Isotta Cainero, Elena Cerutti, Mario Faretta, Gaetano Dellino, Pier Giuseppe Pelicci, Alberto Diaspro, Luca Lanzanò:
Measuring Nanoscale Distances by Structured Illumination Microscopy and Image Cross-Correlation Spectroscopy (SIM-ICCS). Sensors 21(6): 2010 (2021)

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