"Phase Deflectometry for Defect Detection of High Reflection Objects."

Xian-Ming Cheng et al. (2023)

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DOI: 10.3390/S23031607

access: open

type: Journal Article

metadata version: 2024-05-13

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Xian-Ming Cheng, Tingting Wang, Wen-Bin Zhu, Bai-Di Shi, Wei Chen:
Phase Deflectometry for Defect Detection of High Reflection Objects. Sensors 23(3): 1607 (2023)

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