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"Generative Adversarial Network-Based Fault Detection in Semiconductor ..."
Jeong Eun Choi et al. (2023)
- Jeong Eun Choi, Da Hoon Seol, Chan Young Kim, Sang Jeen Hong:
Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data. Sensors 23(4): 1889 (2023)
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