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"Electrical Characterization of the Backside Interface on BSI Global ..."
Célestin Doyen et al. (2020)
- Célestin Doyen
, Stéphane Ricq, Pierre Magnan, Olivier Marcelot, Marios Barlas, Sébastien Place:
Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process. Sensors 20(1): 287 (2020)
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