Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Durability Assessment of Bonded Piezoelectric Wafer Active Sensors for ..."

Jesús N. Eiras, Ludovic Gavérina, Jean-Michel Roche (2024)

> Home

Details and statistics

DOI: 10.3390/S24020450

access: open

type: Journal Article

metadata version: 2024-03-16

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/EirasGR24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/EirasGR24
Jesús N. Eiras, Ludovic Gavérina, Jean-Michel Roche:
Durability Assessment of Bonded Piezoelectric Wafer Active Sensors for Aircraft Health Monitoring Applications. Sensors 24(2): 450 (2024)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.