"Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique."

Jiuhao Ge et al. (2020)

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DOI: 10.3390/S20123390

access: open

type: Journal Article

metadata version: 2020-08-13

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Jiuhao Ge, Chenkai Yang, Ping Wang, Yongsheng Shi:
Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique. Sensors 20(12): 3390 (2020)

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