"A Survey of Image-Based Fault Monitoring in Additive Manufacturing: Recent ..."

Ryanne Gail Kim et al. (2023)

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DOI: 10.3390/S23156821

access: open

type: Journal Article

metadata version: 2024-08-04

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Ryanne Gail Kim, Mideth B. Abisado, Jocelyn Flores Villaverde, Gabriel Avelino R. Sampedro:
A Survey of Image-Based Fault Monitoring in Additive Manufacturing: Recent Developments and Future Directions. Sensors 23(15): 6821 (2023)

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