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"Printed Circuit Board Defect Detection Using Deep Learning via A ..."

Jungsuk Kim et al. (2021)

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DOI: 10.3390/S21154968

access: open

type: Journal Article

metadata version: 2021-08-12

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Jungsuk Kim, Jungbeom Ko, Hojong Choi, Hyunchul Kim:
Printed Circuit Board Defect Detection Using Deep Learning via A Skip-Connected Convolutional Autoencoder. Sensors 21(15): 4968 (2021)

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