"Multi-Defect Detection in Additively Manufactured Lattice Structures Using ..."

Yening Shu et al. (2022)

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DOI: 10.3390/S22239167

access: open

type: Journal Article

metadata version: 2024-08-22

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Yening Shu, Saptarshi Mukherjee, Tammy Chang, Abigail Gilmore, Joseph W. Tringe, David Stobbe, Kenneth J. Loh:
Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors 22(23): 9167 (2022)

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