"Compensation for Process and Temperature Dependency in a CMOS Image Sensor."

Shuang Xie, Albert Theuwissen (2019)

> Home

Details and statistics

DOI: 10.3390/S19040870

access: open

type: Journal Article

metadata version: 2019-07-29

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/XieT19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/XieT19
Shuang Xie, Albert Theuwissen:
Compensation for Process and Temperature Dependency in a CMOS Image Sensor. Sensors 19(4): 870 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.