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"Bayesian off-line detection of multiple change-points corrupted by ..."

Jean-Yves Tourneret, Michel Doisy, Marc Lavielle (2003)

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DOI: 10.1016/S0165-1684(03)00106-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jean-Yves Tourneret, Michel Doisy, Marc Lavielle:
Bayesian off-line detection of multiple change-points corrupted by multiplicative noise: application to SAR image edge detection. Signal Process. 83(9): 1871-1887 (2003)

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