"Evaluating regression test suites based on their fault exposure capability."

Sebastian G. Elbaum, John C. Munson (2000)

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DOI: 10.1002/1096-908X(200005/06)12:3<171::AID-SMR209>3.0.CO;2-4

access: closed

type: Journal Article

metadata version: 2020-05-20

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