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"Reliability assessment with uncertain thresholds considering degradation ..."

Chun Wei et al. (2023)

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DOI: 10.1007/S00500-023-09274-7

access: closed

type: Journal Article

metadata version: 2023-11-28

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  dblp key:
  - journals/soco/WeiSZLW23
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  - https://dblp.org/rec/journals/soco/WeiSZLW23
Chun Wei, Haiyan Shi, Zhiqiang Zhang, Baoliang Liu, Lei Wei:
Reliability assessment with uncertain thresholds considering degradation and shock. Soft Comput. 27(24): 18441-18450 (2023)

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