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"Locating splicing forgery by fully convolutional networks and conditional ..."

Bo Liu, Chi-Man Pun (2018)

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DOI: 10.1016/J.IMAGE.2018.04.011

access: closed

type: Journal Article

metadata version: 2023-02-17

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Bo Liu, Chi-Man Pun:
Locating splicing forgery by fully convolutional networks and conditional random field. Signal Process. Image Commun. 66: 103-112 (2018)

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