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"A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method."

Xin Bi, Chungang Zhuang, Han Ding (2009)

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DOI: 10.1109/LSP.2009.2014113

access: closed

type: Journal Article

metadata version: 2017-05-28

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Xin Bi, Chungang Zhuang, Han Ding:
A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method. IEEE Signal Process. Lett. 16(4): 311-314 (2009)

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