"LW-YOLO: Lightweight Deep Learning Model for Fast and Precise Defect ..."

Zhaohui Yuan et al. (2024)

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DOI: 10.3390/SYM16040418

access: open

type: Journal Article

metadata version: 2024-07-19

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  - journals/symmetry/YuanTNY24
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  - https://dblp.org/rec/journals/symmetry/YuanTNY24
Zhaohui Yuan, Xiangyang Tang, Hao Ning, Zhengzhe Yang:
LW-YOLO: Lightweight Deep Learning Model for Fast and Precise Defect Detection in Printed Circuit Boards. Symmetry 16(4): 418 (2024)

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