"Functional Test Generation for Digital Circuits Described Using Binary ..."

Magdy S. Abadir, Hassan K. Reghbati (1986)

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DOI: 10.1109/TC.1986.1676774

access: closed

type: Journal Article

metadata version: 2017-05-20

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Magdy S. Abadir, Hassan K. Reghbati:
Functional Test Generation for Digital Circuits Described Using Binary Decision Diagrams. IEEE Trans. Computers 35(4): 375-379 (1986)

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