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"Functional Test Generation for Digital Circuits Described Using Binary ..."
Magdy S. Abadir, Hassan K. Reghbati (1986)
- Magdy S. Abadir, Hassan K. Reghbati:
Functional Test Generation for Digital Circuits Described Using Binary Decision Diagrams. IEEE Trans. Computers 35(4): 375-379 (1986)
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