"A Probabilistic Approach of Designing More Reliable Logic Gates with ..."

Sung C. Hu (1975)

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DOI: 10.1109/T-C.1975.224113

access: closed

type: Journal Article

metadata version: 2017-05-20

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Sung C. Hu:
A Probabilistic Approach of Designing More Reliable Logic Gates with Asymmetric Input Faults. IEEE Trans. Computers 24(10): 1012-1014 (1975)

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