"Identifying the Worst Reliability Input Vectors and the Associated ..."

Walid Ibrahim (2016)

> Home

Details and statistics

DOI: 10.1109/TC.2015.2458868

access: closed

type: Journal Article

metadata version: 2021-04-09

- view
  authority control:
- export record
  dblp key:
  - journals/tc/Ibrahim16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/Ibrahim16
Walid Ibrahim:
Identifying the Worst Reliability Input Vectors and the Associated Critical Logic Gates. IEEE Trans. Computers 65(6): 1748-1760 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.