"Comments on "An Optimal Algorithm for Testing Stuck-at Faults in Random ..."

Ravindra Nair (1979)

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DOI: 10.1109/TC.1979.1675331

access: closed

type: Journal Article

metadata version: 2017-05-20

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Ravindra Nair:
Comments on "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories". IEEE Trans. Computers 28(3): 258-261 (1979)

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