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"On the Number of Tests to Detect All Path Delay Faults in Combinational ..."

Irith Pomeranz, Sudhakar M. Reddy (1996)

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DOI: 10.1109/12.481486

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/PomeranzR96a
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  persistent URL:
  - https://dblp.org/rec/journals/tc/PomeranzR96a
Irith Pomeranz, Sudhakar M. Reddy:
On the Number of Tests to Detect All Path Delay Faults in Combinational Logic Circuits. IEEE Trans. Computers 45(1): 50-62 (1996)

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