"A Sweeping Line Approach to Interconnect Testing."

José Salinas, Yinan N. Shen, Fabrizio Lombardi (1996)

> Home

Details and statistics

DOI: 10.1109/12.536234

access: closed

type: Journal Article

metadata version: 2017-05-20

- view
  authority control:
- export record
  dblp key:
  - journals/tc/SalinasSL96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/SalinasSL96
José Salinas, Yinan N. Shen, Fabrizio Lombardi:
A Sweeping Line Approach to Interconnect Testing. IEEE Trans. Computers 45(8): 917-929 (1996)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.