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"Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs."

Mukesh Agrawal, Krishnendu Chakrabarty (2015)

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DOI: 10.1109/TCAD.2015.2419227

access: closed

type: Journal Article

metadata version: 2023-03-09

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  - https://dblp.org/rec/journals/tcad/AgrawalC15
Mukesh Agrawal, Krishnendu Chakrabarty:
Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(9): 1523-1536 (2015)

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