"Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration."

Ahmad A. Al-Yamani et al. (2007)

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DOI: 10.1109/TCAD.2007.8361584

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda:
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5): 907-918 (2007)

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