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"Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test."

Sobeeh Almukhaizim, Ozgur Sinanoglu (2009)

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DOI: 10.1109/TCAD.2008.2009159

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - https://dblp.org/rec/journals/tcad/AlmukhaizimS09
Sobeeh Almukhaizim, Ozgur Sinanoglu:
Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 298-302 (2009)

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