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"Error bounds for capacitance extraction via window techniques."

Michael W. Beattie, Lawrence T. Pileggi (1999)

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DOI: 10.1109/43.748161

access: closed

type: Journal Article

metadata version: 2020-09-24

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Michael W. Beattie, Lawrence T. Pileggi:
Error bounds for capacitance extraction via window techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(3): 311-321 (1999)

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