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"Analytical Placement Considering the Electron-Beam Fogging Effect."

Jianli Chen, Yao-Wen Chang, Yu-Chen Huang (2021)

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DOI: 10.1109/TCAD.2020.3002570

access: closed

type: Journal Article

metadata version: 2023-02-21

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Jianli Chen, Yao-Wen Chang, Yu-Chen Huang:
Analytical Placement Considering the Electron-Beam Fogging Effect. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 560-573 (2021)

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