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"3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations."

Jaeyong Chung, Yonghyun Kim, Joon-Sung Yang (2014)

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DOI: 10.1109/TCAD.2014.2361629

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/ChungKY14
Jaeyong Chung, Yonghyun Kim, Joon-Sung Yang:
3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12): 2005-2009 (2014)

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