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"Low-Power Scan Operation in Test Compression Environment."

Dariusz Czysz et al. (2009)

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DOI: 10.1109/TCAD.2009.2030445

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/CzyszKLMRT09
Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Scan Operation in Test Compression Environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1742-1755 (2009)

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