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"Native-Conflict and Stitch-Aware Wire Perturbation for Double Patterning ..."

Shao-Yun Fang, Szu-Yu Chen, Yao-Wen Chang (2012)

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DOI: 10.1109/TCAD.2011.2179039

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/FangCC12
Shao-Yun Fang, Szu-Yu Chen, Yao-Wen Chang:
Native-Conflict and Stitch-Aware Wire Perturbation for Double Patterning Technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(5): 703-716 (2012)

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